From 213fee8bb772f45002452d325a87428d317e3603 Mon Sep 17 00:00:00 2001
From: Fred Gylys-Colwell <fredgc@google.com>
Date: Sun, 31 Jan 2016 13:08:27 -0800
Subject: [PATCH] Re-apply SimultaneousDecrypt tests

A recent merge accidentally removed the unit tests
SimultaneousDecrypt* from oemcrypto_test.  Also the unit test
GetKeyDataNullPointer was disabled.  This CL puts those tests back in.

bug: 26892550

Change-Id: I9d8f0a38e65727231543248135366331a6f52b02
---
 .../oemcrypto/test/oemcrypto_test.cpp         | 57 ++++++++++++++++++-
 1 file changed, 54 insertions(+), 3 deletions(-)

diff --git a/libwvdrmengine/oemcrypto/test/oemcrypto_test.cpp b/libwvdrmengine/oemcrypto/test/oemcrypto_test.cpp
index 5da8cca3..8e725445 100644
--- a/libwvdrmengine/oemcrypto/test/oemcrypto_test.cpp
+++ b/libwvdrmengine/oemcrypto/test/oemcrypto_test.cpp
@@ -1646,9 +1646,7 @@ TEST_F(OEMCryptoKeyboxTest, NormalGetKeyData) {
   ASSERT_EQ(OEMCrypto_SUCCESS, sts);
 }
 
-// TODO(fredgc): warn people that this will be turned on.  It causes a
-// seg fault on some devices at the moment.
-TEST_F(OEMCryptoKeyboxTest, DISABLED_GetKeyDataNullPointer) {
+TEST_F(OEMCryptoKeyboxTest, GetKeyDataNullPointer) {
   OEMCryptoResult sts;
   uint8_t key_data[256];
   sts = OEMCrypto_GetKeyData(key_data, NULL);
@@ -2366,6 +2364,59 @@ TEST_F(OEMCryptoSessionTests, DecryptZeroDuration) {
   ASSERT_NO_FATAL_FAILURE(s.TestDecryptCTR());
 }
 
+TEST_F(OEMCryptoSessionTests, SimultaneousDecrypt) {
+  vector<Session> s(8);
+  for (int i = 0; i < 8; i++) {
+    ASSERT_NO_FATAL_FAILURE(s[i].open());
+  }
+  for (int i = 0; i < 8; i++) {
+    ASSERT_NO_FATAL_FAILURE(s[i].GenerateTestSessionKeys());
+    ASSERT_NO_FATAL_FAILURE(s[i].FillSimpleMessage(kDuration, 0,
+                                                   s[i].get_nonce()));
+    ASSERT_NO_FATAL_FAILURE(s[i].EncryptAndSign());
+  }
+  for (int i = 0; i < 8; i++) {
+    ASSERT_NO_FATAL_FAILURE(s[i].LoadTestKeys());
+  }
+  for (int i = 0; i < 8; i++) {
+    ASSERT_NO_FATAL_FAILURE(s[i].TestDecryptCTR());
+  }
+  // Second call to decrypt for each session.
+  for (int i = 0; i < 8; i++) {
+    ASSERT_NO_FATAL_FAILURE(s[i].TestDecryptCTR());
+  }
+}
+
+TEST_F(OEMCryptoSessionTests, SimultaneousDecryptWithLostMessage) {
+  vector<Session> s(8);
+  for (int i = 0; i < 8; i++) {
+    ASSERT_NO_FATAL_FAILURE(s[i].open());
+  }
+  for (int i = 0; i < 8; i++) {
+    ASSERT_NO_FATAL_FAILURE(s[i].GenerateTestSessionKeys());
+    ASSERT_NO_FATAL_FAILURE(s[i].FillSimpleMessage(kDuration, 0,
+                                                   s[i].get_nonce()));
+    ASSERT_NO_FATAL_FAILURE(s[i].EncryptAndSign());
+  }
+  // First set of messages are lost.  Generate second set.
+  for (int i = 0; i < 8; i++) {
+    ASSERT_NO_FATAL_FAILURE(s[i].GenerateTestSessionKeys());
+    ASSERT_NO_FATAL_FAILURE(s[i].FillSimpleMessage(kDuration, 0,
+                                                   s[i].get_nonce()));
+    ASSERT_NO_FATAL_FAILURE(s[i].EncryptAndSign());
+  }
+  for (int i = 0; i < 8; i++) {
+    ASSERT_NO_FATAL_FAILURE(s[i].LoadTestKeys());
+  }
+  for (int i = 0; i < 8; i++) {
+    ASSERT_NO_FATAL_FAILURE(s[i].TestDecryptCTR());
+  }
+  // Second call to decrypt for each session.
+  for (int i = 0; i < 8; i++) {
+    ASSERT_NO_FATAL_FAILURE(s[i].TestDecryptCTR());
+  }
+}
+
 struct SampleSize {
   size_t clear_size;
   size_t encrypted_size;