Fail early in oemcrypto unit tests

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Merge from widevine of http://go/wvgerrit/16293

This CL adds ASSERT_NO_FATAL_FAILURE around many subroutines in the
oemcrypto unit tests.  This should help debug tradefed tests because
it will cause a test to stop after the first error.  This is important
for tests that are failing on OpenSession and then spewing garbage
into the log as every other ASSERT fails after that.

I also replaced the home-grown EXPECT_ALMOST with the standard
EXPECT_NEAR.  I also passed the file through clang-format to corect
whitespace problems.

Change-Id: I2c2c1c1dbeac234291dafc9fa8c23da8d270eb4e

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This commit is contained in:

Fred Gylys-Colwell

2015-12-16 13:23:39 -08:00

parent 12db6099d2

commit 17faabee44

1 changed files with 1036 additions and 1041 deletions

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libwvdrmengine/oemcrypto/test/oemcrypto_test.cpp

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