Merged from http://go/wvgerrit/146589
lshal is for hidl HALs only, dumpsys is for aidl HALs.
Add option "-a" to dump both CDM metrics and properties
because adb bugreport calls dump() with option "-a".
Test: adb bugreport
Bug: 220996660
Change-Id: Ib2a73f3f9f353b8435735dd019a547b62b066725
To match the v17 change.
[ Merge of go/wvgerrit/146231 ]
Bug: 216585596
Test: atset WidevineGenericOpsTests
Change-Id: I7eb25a5db30a82cf8015e3c19af419c02a1d5002
Merged-In: I7eb25a5db30a82cf8015e3c19af419c02a1d5002
Fix the conversion from in_args.keyId to Cdm format
which causes nullptr dereference signal 11 faults.
Test: atest
atest-dev GtsMediaTestCases:com.google.android.media.gts.WidevineGenericOpsTests
Bug: 214410088
Change-Id: If84863e2501d4ccae7b8b38dceb707bb4bfa12fb
The interface is defined in
hardware/interfaces/drm/aidl(http://go/ag/15329852).
Test: build
m android.hardware.drm-service.widevine -j128
Test: build_and_run_all_unit_tests.sh
for hidl tests
Test: atest VtsAidlHalDrmTargetTest
Bug: 200055138
Bug: 170964303
Change-Id: If2f2a129914436ba5cef1c46f6cb9415e12c3d1c
Added legacy_by_exception_only to:
libwvdrmengine/cdm/test/coverage-test.mk
Bug: 68860345
Bug: 151177513
Bug: 151953481
Test: m all
Change-Id: I245a84bb0ef081a4faedde51f0e815478172db51
(This is a merge of http://go/wvgerrit/140850.)
This patch fixes a number of minor issues in the codebase (mostly
instances of 0-as-nullptr, but also some member shadowing and a missing
override) that were being hidden by the fact that depending on Protobuf
disables these diagnostics. And which will be unhidden when a later
patch removes that behavior from Protobuf.
Bug: 208304830
Test: x86-64
Change-Id: I4b0b1264748880b3726a6388d589868d898f949e
(This is a merge of http://go/wvgerrit/139989.)
Googletest added a new, more powerful MOCK_METHOD() macro in 1.10. This
patch updates all our usage of the old MOCK_METHOD family to the new
macro. Full details can be found at
https://github.com/google/googletest/blob/release-1.10.0/googlemock/docs/cook_book.md#creating-mock-classes
but in brief, the new MOCK_METHOD() replaces the entire old MOCK_METHOD
family and has the following advantages:
1) No need to count parameters or update the macro name when changing
parameters.
2) No need for a different macro for const methods.
3) The ability to specify override, noexcept, and other function
qualifiers.
4) The macro order is now the same as C++ method definition order:
Return Type -> Name -> Arguments -> Qualifiers
In addition to upgrading all our usage sites to the new macro, the
addition of the override qualifier to our MOCK_METHODs helped uncover
several cases where we were using MOCK_METHOD to override methods that
didn't exist. This is a great example of why the override qualifier is
so useful. These places have been updated, by removing the invalid and
unused mock method.
Bug: 207693687
Test: build_and_run_all_unit_tests
Change-Id: Iaad4a22c7f72bb48b1356fe01a41eb0a2f555244
[ Merge of http://go/wvgerrit/143889 ]
New test binary for generating code coverage information. Run several
reliable, short runnning unit tests. Actual test failures do not
affect the result of this test.
Bug: 138941105
Bug: 191681397
Test: Android cdm_coverage_test
Change-Id: I6b74d361a8a0e2896e0489acaa64d264158ecaa4
[ Merge of http://go/wvgerrit/143370 ]
[ Cherry-pick off http://ag/16624952 ]
Devices without a keybox may not have access to a device ID if the OEM
uses the device ID from the keybox as its source of truth. For
devices which have lost their keybox, OEMCrypto_GetDeviceID() was
assumed to return ERROR_KEYBOX_INVALID if that was the case; however,
Qualcomm's implementation was returning ERROR_NO_DEVICEID. Given that
both error codes are appropriate, the CDM has been updated to accept
both as an indication that the device ID cannot be retrieved, and that
the null device ID should be returned.
Bug: 190504842
Bug: 214113125
Test: Manual test
Change-Id: I8fb8a1bddfe895062b707b51fcadffd983adb40e
