Fix the conversion from in_args.keyId to Cdm format
which causes nullptr dereference signal 11 faults.
Test: atest
atest-dev GtsMediaTestCases:com.google.android.media.gts.WidevineGenericOpsTests
Bug: 214410088
Change-Id: If84863e2501d4ccae7b8b38dceb707bb4bfa12fb
The interface is defined in
hardware/interfaces/drm/aidl(http://go/ag/15329852).
Test: build
m android.hardware.drm-service.widevine -j128
Test: build_and_run_all_unit_tests.sh
for hidl tests
Test: atest VtsAidlHalDrmTargetTest
Bug: 200055138
Bug: 170964303
Change-Id: If2f2a129914436ba5cef1c46f6cb9415e12c3d1c
Added legacy_by_exception_only to:
libwvdrmengine/cdm/test/coverage-test.mk
Bug: 68860345
Bug: 151177513
Bug: 151953481
Test: m all
Change-Id: I245a84bb0ef081a4faedde51f0e815478172db51
(This is a merge of http://go/wvgerrit/140850.)
This patch fixes a number of minor issues in the codebase (mostly
instances of 0-as-nullptr, but also some member shadowing and a missing
override) that were being hidden by the fact that depending on Protobuf
disables these diagnostics. And which will be unhidden when a later
patch removes that behavior from Protobuf.
Bug: 208304830
Test: x86-64
Change-Id: I4b0b1264748880b3726a6388d589868d898f949e
(This is a merge of http://go/wvgerrit/139989.)
Googletest added a new, more powerful MOCK_METHOD() macro in 1.10. This
patch updates all our usage of the old MOCK_METHOD family to the new
macro. Full details can be found at
https://github.com/google/googletest/blob/release-1.10.0/googlemock/docs/cook_book.md#creating-mock-classes
but in brief, the new MOCK_METHOD() replaces the entire old MOCK_METHOD
family and has the following advantages:
1) No need to count parameters or update the macro name when changing
parameters.
2) No need for a different macro for const methods.
3) The ability to specify override, noexcept, and other function
qualifiers.
4) The macro order is now the same as C++ method definition order:
Return Type -> Name -> Arguments -> Qualifiers
In addition to upgrading all our usage sites to the new macro, the
addition of the override qualifier to our MOCK_METHODs helped uncover
several cases where we were using MOCK_METHOD to override methods that
didn't exist. This is a great example of why the override qualifier is
so useful. These places have been updated, by removing the invalid and
unused mock method.
Bug: 207693687
Test: build_and_run_all_unit_tests
Change-Id: Iaad4a22c7f72bb48b1356fe01a41eb0a2f555244
[ Merge of http://go/wvgerrit/143889 ]
New test binary for generating code coverage information. Run several
reliable, short runnning unit tests. Actual test failures do not
affect the result of this test.
Bug: 138941105
Bug: 191681397
Test: Android cdm_coverage_test
Change-Id: I6b74d361a8a0e2896e0489acaa64d264158ecaa4
[ Merge of http://go/wvgerrit/143370 ]
[ Cherry-pick off http://ag/16624952 ]
Devices without a keybox may not have access to a device ID if the OEM
uses the device ID from the keybox as its source of truth. For
devices which have lost their keybox, OEMCrypto_GetDeviceID() was
assumed to return ERROR_KEYBOX_INVALID if that was the case; however,
Qualcomm's implementation was returning ERROR_NO_DEVICEID. Given that
both error codes are appropriate, the CDM has been updated to accept
both as an indication that the device ID cannot be retrieved, and that
the null device ID should be returned.
Bug: 190504842
Bug: 214113125
Test: Manual test
Change-Id: I8fb8a1bddfe895062b707b51fcadffd983adb40e
Merge from Widevine repo of http://go/wvgerrit/142349
If a provisioning request is sent, but no response is loaded, we
should fall back to L3. This covers the case where the OTA request is
malformed and the provisioning server ignores it.
This might happen if the device has a bad KM key.
Test: manual testing
Bug: 210823889
Bug: 210807585
Change-Id: I951241539ace97b668868d5abf8a9811d874fb28
Merge from Widevine repo of http://go/wvgerrit/142150 (part 2)
For an EVT device, without a keybox or with a test keybox, we want it
to fall back to L3. However, when running the unit or integration
tests it should continue running tests with test keybox. This will
allow us to test L1 oemcrypto on an EVT device, while still using an
EVT device for dogfooding video content at the L3 level.
Bug: 210807585
Bug: 210823889
Change-Id: I30c35134239db35bb39f11f75220063181987763
Merge from Widevine repo of http://go/wvgerrit/142150 (part 1)
For an EVT device, without a keybox or with a test keybox, we want it
to fall back to L3. However, when running the unit or integration
tests it should continue running tests with test keybox. This will
allow us to test L1 oemcrypto on an EVT device, while still using an
EVT device for dogfooding video content at the L3 level.
This CL modifes the HIDL and non-HIDL plugin, so it was hand merged to
downstream branches.
Bug: 210807585
Merged-In: I85b96f127abe30f8f061b242f7580fa8f6c01776
Change-Id: I85b96f127abe30f8f061b242f7580fa8f6c01776
[ Merge of http://go/wvgerrit/142249 and http://go/ag/16307264 ]
This adds concurrency protection to a session when policy
timers are reset to from v15 to v16. The v15 policy timer may still be
in use by the decryption thread.
Bug: 204282907
Bug: 207304220
Test: Unit/Integration tests, GtsMediaTestCases
Change-Id: I4967b3927e47733fb23a1a12b6094d1cd2072918
